id	author	title	date	pages	extension	mime	words	sentences	flesch	summary	cache	txt
work_m2cwseludvhjrmju2eamkqcyby	L TONG	Novel yield model for integrated circuits with clustered defects	2008	8	.pdf	application/pdf	5397	633	68	Clustered defects cause the conventional Poisson yield model Although some yield models, such as negative binomial or compound Poisson models, consider the effects of defect clustering on yield prediction, these models have some drawbacks. This study presents a novel yield model that employs General Regression Neural Network (GRNN) to predict wafer yield for The proposed method utilizes five relevant variables as input for the GRNN yield model. Keywords: Clustered defects; General regression neural network; IC; Pattern; Yield model GRNN to predict wafer yield with clustered defects. The prediction accuracy of the proposed approach is compared with those of the negative binominal yield model and Meyer and Park (2003) present a center-satellite model to Predicting defect-tolerant yield in the embedded core context. The GRNN model, then, is used in this study to predict wafer yield. defect clustering patterns to predict the wafer yield in IC Novel yield model for integrated circuits with clustered defects	./cache/work_m2cwseludvhjrmju2eamkqcyby.pdf	./txt/work_m2cwseludvhjrmju2eamkqcyby.txt