id	author	title	date	pages	extension	mime	words	sentences	flesch	summary	cache	txt
work_w5diwswuezgqniis7ln6pdwejq	Pascale Richardin	Identification of Different Copper Green Pigments in Renaissance Paintings by Cluster-TOF-SIMS Imaging Analysis	2011	8	.pdf	application/pdf	4280	512	74	Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging using cluster primary ion ClusterTOF-SIMS, Matthias Grünewald, Mass spectrometry imaging, Painting cross-section The aim of this research is to use time-offlight secondary ion mass spectrometry (TOF-SIMS) imaging using cluster primary ion beams to identify and locate the area of 200 μm×200 μm delimited by the green square; (b to d) TOF-SIMS ion images recorded in the positive-ion mode: (b) images in the positive-ion mode of copper carboxylate ions: (j) sum of the Cun TOF-SIMS mass spectra of copper carboxylates from the area rich in lipids (a) in the negative ion mode and (b) in the 1736 Richardin et al.: TOF-SIMS Copper Green Pigments 1736 Richardin et al.: TOF-SIMS Copper Green Pigments 1736 Richardin et al.: TOF-SIMS Copper Green Pigments 1736 Richardin et al.: TOF-SIMS Copper Green Pigments Identification of Different Copper Green Pigments in Renaissance Paintings by Cluster-TOF-SIMS Imaging Analysis	./cache/work_w5diwswuezgqniis7ln6pdwejq.pdf	./txt/work_w5diwswuezgqniis7ln6pdwejq.txt