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11:25 114 LE
MICROCOPY RESOLUTION TEST CHART
NATIONAL BUREAU OF STANDARDS - 1963
T
2
ORH.uol.-3117
Conf. 670513
B..
1494
MASTE

T
..
ELA
.
.
JUN 2 2 1969
ELECTRON MICROSCOPE OBSERVATIONS ON THE DISLOCATION. ARRANGEMEN
IN COPPER SINGLE CRYSTALS IN THE STRESSED CONDITION
CFSTI RUCES
J. C. Cru:np III and F. W. Young, Jr. .
HE
LE
ET A
Solid State Division, Oak Ridge National Laboratory..a s 3.00
Oak Ridge, Tennessee
The results of recent investigations by Young and Sherrill (1966)
YR
on processes occurring in the pre-yield rarge of copper single crystals
using Borrmann X-ray topography techniques have clearly indicated that
back motion of dislocations occurs when stressed crystals are relaxed and
that the dislocation configurations in the stress-relaxed condition are
.
4
different from those in the stress-applied condition. Similar results
have also been reported by Brydges. (1966), who has made surface etching
studies on the early stages of plastic deformation in copper. This study
has been extended into higher stress ranges using transmission electron
ALT
microscopy techniques.
Three copper single crystals having dimensions 1 cm by 1 cm by
2 cm with one of their large faces parallel to the (111) planes and with
their long axis several degrees off of either [211] or [110] were spring
AA
loaded under compression and were irradiated at ambient-temperature with:
2 x 10'' fast neutrons with the stress applied to pin dislocations in
their as-stressed position. The first crystal was compressed to 500 gm/mm²
resolved shear stress, the second to 100 gm/mm' and the third to 40 gm/mm..
The yield points for similar crystals compressed in an Instron were less
than 20 gm/mm resolved shear stress. Lamella parallel to the primary
slip plane were cut from the center of the crystals with an acid saw
OTS
*
.
Research sponsored by the U. S. Atomic Energy Commission under contract
with Union Carbide Corporation.
DISTRIBUTION OE THIS DOCUMENL IS UNLIMITED.
SIL
hat
W
and electropolished for electron microscope studies.
The dislocation configurations observered on the primary slip
planes in the crystal compressed to 500 gm/mm² were identical to those
which have been observed previously in copper samples similarly stressed
and then relaxed. The most prominent feature in this crystal was the
presence of dislocation bundles which tended to be aligned along the
traces of the conjugate and critical planes and which were composed of
primary edge dislocation dipoles and some secondary edge dislocations.
No long single dislocations and only a few short jogged screw dislo-
cations have been observed in this crystal.
The dislocation arrangements in the crystal compressed to 100 gm/
mm". were different from those observed previously in similarly stressed
crystals studied after the stress was removed and also from those observed
in the crystal compressed to 500 gm/mm². Whereas previous studies have
indicated that large numbers of edge dislocation bundles were present in
crystals stressed to this range and then relaxed, very few bundles have
been observed during the present investigation. A number of long dislo-
cations, some of which were in the screw orientation and others which were
in a mixed orientation, have been observed in this crystal, however, and
an
these have not previously been reported in crystals similarly stressed and
relaxed.
The results of deformation in the crystal which was compressed to
40 gm/mm indicate the presence in this crystal of numerous long dislo- :
cations, most of which are in a mixed orientation, which lie on the primary
slip planes and intersect to form networks (Fig. 1). A few single edge
dipolės have been seen but no bundles of edge dipoles.
-3-
Apparently little or no relaxation occurs when a crystal stressed
to 500 gm/mm” is relaxed, and the dislocation arrangements in such a crystal
in the stress-relaxed condition are, therefore, similar to those in the
crystal in the stress-applied condition. For lower stresses, however,
i.e., 100 gm/mm' or less, relaxation does occur and the dislocation con-
figurationis observed in the stress-relaxed condition very likely do not
represent the true dynamic phenomena in the stressed crystal.
.
LEGAL NOTICE
This report was prepared as an account of Government sponsored work. Noither the United
States, nor the Commission, nor any person acting of behalf of the Commission:
A. Makes any warranty or representation, expressed or implied, with rospect to the accu-
racy, comploteness, or usefulness of the information contained in this report, or that the use
of any information, apparatus, method, or process disclosed in this report may not infringe
privately ownod righto; or
B. Assumos any liabilities with respect to the use of, or for damages resulting from o
uso of any information, apparatus, method, or process disclosed in this report.
As used in the above, “person acting on behalf of the Compassion" includes any em-
ployoe or contractor of the Commission, or employee of such contractor, to the oxtent that
such omployee or contractor of the Commiosion, or employee of such contractor prepares,
disseminates, os provides access to, any faformation pursuant to his employment or contract
with the Commission, or his employment with such contractor.
FIGURE CAPTION
Fig. 1. Electron Micrograph of 60° Dislocations in Copper Single Crystal
in the As-stressed Condition.
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DATE FILMED
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